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Generally this condition is required to restrict the current carrier accumulation near the junction. When a diode is reverse biased the width of the depletion region increases.

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Semiconductor devices leakage current.
Leakage current of junction diode is. Reverse leakage current is also known as zero gate voltage drain current with mosfets. Diffusion of carriers from the semiconductor into the metal thermionic emission of carriers across the schottky barrier and quantum mechanical tunneling through the barrier. Dark saturation current indicates the leakage current density flowing through the diode in the absence of light hence dark.
This parameter is the characteristic of the diode under consideration and indicates the amount of recombination which occurs within it. Reverse biased diode current junction leakage parasitic diodes formed between the diffusion region of the transistor and substrate consumes power in the form of reverse bias current which is drawn from the power supply. The current across a metal semiconductor junction is mainly due to majority carriers.
Junction leakage results from minority carrier diffusion and drift near the edge of depletion regions. An important conduction limitation of pn junction diode is leakage current. Leakage electronics in electronics leakage is the gradual transfer of electrical energy across a boundary normally viewed as insulating such as the spontaneous discharge of a charged capacitor magnetic coupling of a transformer with other components or flow of current across a transistor in the off state or a reverse polarized diode.
The term is particularly applicable to mostly semiconductor junctions especially diodes and thyristors. Three distinctly different mechanisms exist. Even though diodes are one way devices and they are only supposed to conduct current through them when they receive forward voltage positive voltage to the anode.
The leakage current increased with temperature. The leakage current of diode is the current that the diode will leak when a reverse voltage is applied to it. Pn junction diode electrostatics a depletion region in which nand pare each much smaller than the net dopantconcentration is formed at the junction between p and n type regions a built in potential barrier voltage drop exists across the depletion region opposing carrier diffusion due to a concentration gradient across the junction.

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